DocumentCode :
1500965
Title :
A Survey on Transfer Learning
Author :
Pan, Sinno Jialin ; Yang, Qiang
Author_Institution :
Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
Volume :
22
Issue :
10
fYear :
2010
Firstpage :
1345
Lastpage :
1359
Abstract :
A major assumption in many machine learning and data mining algorithms is that the training and future data must be in the same feature space and have the same distribution. However, in many real-world applications, this assumption may not hold. For example, we sometimes have a classification task in one domain of interest, but we only have sufficient training data in another domain of interest, where the latter data may be in a different feature space or follow a different data distribution. In such cases, knowledge transfer, if done successfully, would greatly improve the performance of learning by avoiding much expensive data-labeling efforts. In recent years, transfer learning has emerged as a new learning framework to address this problem. This survey focuses on categorizing and reviewing the current progress on transfer learning for classification, regression, and clustering problems. In this survey, we discuss the relationship between transfer learning and other related machine learning techniques such as domain adaptation, multitask learning and sample selection bias, as well as covariate shift. We also explore some potential future issues in transfer learning research.
Keywords :
knowledge engineering; learning by example; optimisation; unsupervised learning; data mining; inductive transfer learning; knowledge transfer; machine learning; transductive transfer learning; unsupervised transfer learning; Data mining; Knowledge engineering; Knowledge transfer; Labeling; Learning systems; Machine learning; Machine learning algorithms; Space technology; Testing; Training data; Transfer learning; data mining.; machine learning; survey;
fLanguage :
English
Journal_Title :
Knowledge and Data Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
1041-4347
Type :
jour
DOI :
10.1109/TKDE.2009.191
Filename :
5288526
Link To Document :
بازگشت