DocumentCode
1500970
Title
Evaluation of MPP Voltage and Power of mc-Si PV Modules in Partial Shading Conditions
Author
Paraskevadaki, Evagelia V. ; Papathanassiou, Stavros A.
Author_Institution
Sch. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Athens, Greece
Volume
26
Issue
3
fYear
2011
Firstpage
923
Lastpage
932
Abstract
Photovoltaic (PV) system performance is influenced by several factors, including irradiance, temperature, shading, degradation, mismatch losses, soiling, etc. Shading of a PV array, in particular, either complete or partial, can have a significant impact on its power output and energy yield, depending on array configuration, shading pattern, and the bypass diodes incorporated in the PV modules. In this paper, the effect of partial shading on multicrystalline silicon (mc-Si) PV modules is investigated. A PV module simulation model implemented in P-Spice is first employed to quantify the effect of partial shading on the I-V curve and the maximum power point (MPP) voltage and power. Then, generalized formulae are derived, which permit accurate enough evaluation of MPP voltage and power of mc-Si PV modules, without the need to resort to detailed modeling and simulation. The equations derived are validated via experimental results.
Keywords
SPICE; elemental semiconductors; maximum power point trackers; photovoltaic power systems; power semiconductor diodes; silicon; solar cell arrays; MPP power evaluation; MPP voltage evaluation; PSpice; PV array shading; PV module simulation model; bypass diodes; irradiance; maximum power point voltage; mismatch losses; multicrystalline silicon PV modules; partial shading condition; photovoltaic system; shading pattern; Analytical models; Arrays; Equations; Equivalent circuits; Integrated circuit modeling; Mathematical model; System performance; Maximum power point (MPP); multicrystalline silicon (mc-Si) photovoltaic (PV) modules; partial shading; photovoltaic power systems;
fLanguage
English
Journal_Title
Energy Conversion, IEEE Transactions on
Publisher
ieee
ISSN
0885-8969
Type
jour
DOI
10.1109/TEC.2011.2126021
Filename
5754564
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