Author :
Bidermann, William ; Taguchi, Masao
fDate :
5/1/1999 12:00:00 AM
Keywords :
CMOS process; Circuits; Delay; Jitter; Physics; Radio transmitters; Random access memory; Societies; Very large scale integration; Voltage-controlled oscillators;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1999.760364
