• DocumentCode
    1501206
  • Title

    Current conduction mechanism and gas adsorption effects on device parameters of the Pt/SnOx/diamond gas sensor

  • Author

    Gurbuz, Yasar ; Kang, Weng Poo ; Davidson, Jim L. ; Kerns, David V.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Vanderbilt Univ., Nashville, TN, USA
  • Volume
    46
  • Issue
    5
  • fYear
    1999
  • fDate
    5/1/1999 12:00:00 AM
  • Firstpage
    914
  • Lastpage
    920
  • Abstract
    This paper presents the results from analysis and modeling of the gas sensing performance, current conduction and gas detection mechanisms, and adsorption effects on device parameters of a Pt/SnOx/diamond-based gas sensor. The sensor is sensitive and demonstrates high, repeatable, and reproducible reaction. The sensor response in seconds to small concentrations of O2, CO, and H 2 gases. The current conduction mechanism of the diamond-based CAIS (catalyst/adsorptive-oxide/intrinsic-diamond/semiconductor-diamond) diode was found to be dominated by space charge limited conduction in the forward bias region and tunneling in the reverse bias region, distinctively different from silicon based sensors. While gas adsorption causes a change in the barrier height and tunneling factor, no significant change was observed in the ideality factor over the temperature range investigated. The detection mechanism of the sensor is attributable to the change in occupancy ratio of the oxygen vacancies of the adsorptive oxide layer upon oxygen exposure, increasing the contact potential between adsorptive-oxide and intrinsic-diamond
  • Keywords
    MIS devices; adsorption; diamond; elemental semiconductors; gas sensors; platinum; space-charge-limited conduction; tin compounds; tunnelling; CAIS diode; Pt-SnO-C; adsorptive oxide layer; barrier height; contact potential; current conduction mechanism; device parameters; forward bias region; gas adsorption effects; gas detection mechanisms; gas sensing performance; gas sensor; ideality factor; occupancy ratio; reverse bias region; space charge limited conduction; temperature range; tunneling factor; vacancies; Computer aided instruction; Gas detectors; Gases; Performance analysis; Semiconductor diodes; Sensor phenomena and characterization; Silicon; Space charge; Temperature distribution; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.760397
  • Filename
    760397