• DocumentCode
    1501784
  • Title

    A Taper to Reduce the Straight-to-Bend Transition Loss in Compact Silicon Waveguides

  • Author

    Shen, Hao ; Fan, Li ; Wang, Jian ; Wirth, Justin C. ; Qi, Minghao

  • Author_Institution
    Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
  • Volume
    22
  • Issue
    15
  • fYear
    2010
  • Firstpage
    1174
  • Lastpage
    1176
  • Abstract
    Strong confinement of light in silicon waveguides allows for sharp bends and, as a result, high-density integration. However, the mode transition loss between the straight and bent portions of a silicon waveguide begins to affect the device performance when the bending radius becomes small. In this letter, we show that a transition region with a step taper between the straight and bent portions of the waveguide can effectively reduce this transition loss. This is demonstrated by measuring the intrinsic round-trip losses of micro-racetrack resonators, where ultralow loss can be precisely characterized according to the quality (Q)-factor change. The results show that the taper can suppress the transition loss from 0.016 to 0.0022 dB for a 4.5-μ m bend radius. Consequently, we improve the Q-factor of such a racetrack resonator from 31 000 to 87 000.
  • Keywords
    Q-factor; microcavities; optical waveguides; silicon; waveguide transitions; compact silicon waveguides; high-density integration; micro-racetrack resonators; mode transition loss; quality factor change; step taper; straight-to-bend transition loss; transition region; Micro-resonator; Si waveguide; transition loss;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2010.2050681
  • Filename
    5471201