DocumentCode
1501784
Title
A Taper to Reduce the Straight-to-Bend Transition Loss in Compact Silicon Waveguides
Author
Shen, Hao ; Fan, Li ; Wang, Jian ; Wirth, Justin C. ; Qi, Minghao
Author_Institution
Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
Volume
22
Issue
15
fYear
2010
Firstpage
1174
Lastpage
1176
Abstract
Strong confinement of light in silicon waveguides allows for sharp bends and, as a result, high-density integration. However, the mode transition loss between the straight and bent portions of a silicon waveguide begins to affect the device performance when the bending radius becomes small. In this letter, we show that a transition region with a step taper between the straight and bent portions of the waveguide can effectively reduce this transition loss. This is demonstrated by measuring the intrinsic round-trip losses of micro-racetrack resonators, where ultralow loss can be precisely characterized according to the quality (Q)-factor change. The results show that the taper can suppress the transition loss from 0.016 to 0.0022 dB for a 4.5-μ m bend radius. Consequently, we improve the Q-factor of such a racetrack resonator from 31 000 to 87 000.
Keywords
Q-factor; microcavities; optical waveguides; silicon; waveguide transitions; compact silicon waveguides; high-density integration; micro-racetrack resonators; mode transition loss; quality factor change; step taper; straight-to-bend transition loss; transition region; Micro-resonator; Si waveguide; transition loss;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2010.2050681
Filename
5471201
Link To Document