DocumentCode :
1501883
Title :
Optimization of SPL and THD Performance of Microspeakers Considering Coupling Effects
Author :
Lee, Chang-Min ; Hwang, Sang-Moon
Author_Institution :
Sch. of Mech. Eng., Pusan Nat. Univ., Busan, South Korea
Volume :
47
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
934
Lastpage :
937
Abstract :
Mobile phones have become more versatile as a result of advances in mobile communication technology. The latest mobile phones are able to provide dazzling multimedia entertainment with portability. A microspeaker has become a generic electromechanical part of mobile phones that enables multimedia features. Therefore, the performance of the microspeaker must be improved in line with the increasing demand for high-quality sound produced by the phone. Sound pressure level (SPL) and total harmonic distortion (THD) are the two most common evaluation criteria that are used to quantify the performance of the microspeaker. Therefore, it is necessary to implement an analysis procedure that predicts and quantifies the SPL and THD characteristics. This manuscript suggests a multiphysics analysis procedure that comprehensively considers electromagnetic, mechanical, and acoustic coupling effects. The experimental results confirm the validity of the proposed analysis procedure.
Keywords :
electromagnetic coupling; harmonic distortion; mobile communication; mobile handsets; multimedia communication; optimisation; acoustic coupling effect; electromagnetic coupling effect; high-quality sound; mechanical coupling effect; microspeaker; mobile communication technology; mobile phone; multimedia feature; multiphysics analysis; optimization; sound pressure level; total harmonic distortion; Acoustics; Coils; Couplings; Electromagnetics; Magnetic circuits; Optimization; Response surface methodology; Coupling analysis; microspeaker; response surface method (RSM); sound pressure level (SPL); total harmonic distortion (THD);
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2010.2089502
Filename :
5754710
Link To Document :
بازگشت