DocumentCode
1501973
Title
Chip-scale packaging of power devices and its application in integrated power electronics modules
Author
Liu, Xingsheng ; Jing, Xiukuan ; Lu, Guo-Quan
Volume
24
Issue
2
fYear
2001
fDate
5/1/2001 12:00:00 AM
Firstpage
206
Lastpage
215
Abstract
A power electronics packaging technology utilizing chip-scale packaged (CSP) power devices to build three-dimensional (3-D) integrated power electronics modules (IPEMs) is presented in this paper. The chip-scale packaging structure, termed die dimensional ball grid array (D2BGA), eliminates wire bonds by using stacked solder joints to interconnect power chips. D2BGA package consists of a power chip, inner solder caps, high-lead solder balls, and molding resin. It has the same lateral dimensions as the starting power chip, which makes high-density packaging and module miniaturization possible. This package enables the power chip to combine excellent thermal transfer, high current handling capability, improved electrical characteristics, and ultralow profile packaging. Electrical tests show that the VCE(sat) and on-resistance of the D2BGA high speed insulated-gate-bipolar transistors (IGBTs) are improved by 20% and 30% respectively by eliminating the device wirebonds and other external interconnections, such as the leadframe. In this paper, we present the design, reliability, and processing issues of D2BGA package, and the implementation of these chip-scale packaged power devices in building 30 kW half-bridge power converter modules. The electrical and reliability test results of the packaged devices and the power modules are reported
Keywords
ball grid arrays; chip scale packaging; life testing; modules; moulding; power electronics; D2BGA; chip-scale packaging; current handling capability; device wirebonds; die dimensional ball grid array; electrical characteristics; half-bridge power converter modules; high-density packaging; inner solder caps; integrated power electronics modules; lateral dimensions; module miniaturization; molding resin; power devices; power electronics; reliability test; stacked solder joints; thermal transfer; ultralow profile packaging; Cable insulation; Chip scale packaging; Electric variables; Electronic packaging thermal management; Electronics packaging; Power electronics; Resins; Soldering; Testing; Wire;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/6040.928756
Filename
928756
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