Title :
Improved Variance Estimates of FRF Measurements in the Presence of Nonlinear Distortions Via Overlap
Author :
Barbé, Kurt ; Pintelon, Rik ; Schoukens, Johan ; Lauwers, Lieve
Author_Institution :
Electr. Meas. Dept. (ELEC), Vrije Univ. Brussel, Brussels, Belgium
Abstract :
The frequency response function (FRF) is a common nonparametric modeling tool in many practical engineering problems used for obtaining insight in the device under test. However, the device often behaves nonlinearly. When nonlinearities are detected, the user wants to find out how large these are with respect to the measurement noise. In this paper, we describe a method, based on an overlap technique and periodic excitations, that accurately estimates the FRF, the level of nonlinear distortion, and the measurement noise using only two periods and two random phase realizations of the input signal.
Keywords :
Volterra equations; distortion measurement; frequency measurement; frequency response; noise measurement; nonlinear distortion; FRF measurements; frequency response function; measurement noise; nonlinear distortions; overlap technique; periodic excitations; variance estimates; Distortion measurement; Frequency estimation; Frequency measurement; Frequency response; Noise level; Noise measurement; Nonlinear distortion; Switches; Testing; Time measurement; Frequency domain; Volterra systems; frequency response function (FRF); measurement noise; nonlinear distortions;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2010.2049218