DocumentCode :
1502389
Title :
Wiring Diagnostics Via \\ell _1 -Regularized Least Squares
Author :
Schuet, Stefan
Author_Institution :
Ames Res. Center, Intell. Syst. Div., NASA, Moffett Field, CA, USA
Volume :
10
Issue :
7
fYear :
2010
fDate :
7/1/2010 12:00:00 AM
Firstpage :
1218
Lastpage :
1225
Abstract :
A new method for detecting and locating wiring damage using time domain reflectometry with arbitrary input interrogation signals is presented. This method employs existing ℓ1 regularization techniques from convex optimization and compressed sensing to exploit sparsity in the distribution of faults along the length of a wire, while further generalizing and improving commonly used fault detection techniques based on sliding correlation and peak detection. The method´s effectiveness is demonstrated using a simulated example, and it is shown how Monte Carlo techniques are used to tune it to achieve specific detection goals, like a certain false positive error rate. Furthermore, the method is easily implemented by adapting readily available optimization algorithms to quickly solve large, high resolution, versions of this estimation problem. Finally, the technique is applied to a real data set, which reveals its impressive ability to identify a subtle type of chafing damage on real wire.
Keywords :
Monte Carlo methods; fault location; least squares approximations; time-domain reflectometry; wiring; Monte Carlo techniques; arbitrary input interrogation signals; compressed sensing; convex optimization algorithm; false positive error rate; fault detection techniques; l1 regularization techniques; l1-regularized least squares; peak detection; sliding correlation; time domain reflectometry; wiring damage detection; wiring diagnostics; Aging; Aircraft; Fault detection; Impedance; Least squares methods; Optimization methods; Reflection; Reflectometry; Wire; Wiring; Diagnostics; fault detection; inverse scattering; lossless media; sparsity; time domain reflectometry (TDR); wiring;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2009.2037823
Filename :
5471702
Link To Document :
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