Title :
Minimax description length for signal denoising and optimized representation
Author :
Krim, Hamid ; Schick, Irvin C.
Author_Institution :
ECE/CACC, North Carolina State Univ., Raleigh, NC, USA
fDate :
4/1/1999 12:00:00 AM
Abstract :
Approaches to wavelet-based denoising (or signal enhancement) have generally relied on the assumption of normally distributed perturbations. To relax this assumption, which is often violated in practice, we derive a robust wavelet thresholding technique based on the minimax description length (MMDL) principle. We first determine the least favorable distribution in the ε-contaminated normal family as the member that maximizes the entropy. We show that this distribution, and the best estimate based upon it, namely the maximum-likelihood estimate, together constitute a saddle point. The MMDL approach results in a thresholding scheme that is resistant to heavy tailed noise. We further extend this framework and propose a novel approach to selecting an adapted or best basis (BB) that results in optimal signal reconstruction. Finally, we address the practical case where the underlying signal is known to be bounded, and derive a two-sided thresholding technique that is resistant to outliers and has bounded error
Keywords :
interference suppression; maximum entropy methods; maximum likelihood estimation; minimax techniques; noise; signal reconstruction; signal representation; wavelet transforms; ϵ-contaminated normal family; adapted basis; best basis; entropy; error; heavy tailed noise; least favorable distribution; maximum-likelihood estimate; minimax description length; optimal signal reconstruction; optimized representation; robust wavelet thresholding technique; saddle point; signal denoising; signal enhancement; two-sided thresholding technique; underlying signal; wavelet-based denoising; Entropy; Filtering; Filters; Gaussian noise; Maximum likelihood estimation; Minimax techniques; Noise reduction; Robustness; Signal denoising; Wavelet transforms;
Journal_Title :
Information Theory, IEEE Transactions on