مرکز منطقه ای اطلاع رساني علوم و فناوري - 2010 IEEE International Integrated Reliability Workshop (IRW)

DocumentCode :

1502557

Title :

2010 IEEE International Integrated Reliability Workshop (IRW)

Volume :

Issue :

fYear :

2010

fDate :

6/1/2010 12:00:00 AM

Firstpage :

631

Lastpage :

631

Abstract :

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.

fLanguage :

English

Journal_Title :

Electron Device Letters, IEEE

Publisher :

ieee

ISSN :

0741-3106

Type :

jour

DOI :

10.1109/LED.2010.2050815

Filename :

5471733

Link To Document :