• DocumentCode
    1502828
  • Title

    Quantitative study of the impact of design and synthesis options on processor core performance

  • Author

    Bautista, Tomas ; Nunez, Antonio

  • Author_Institution
    SICAD Div., Univ. of Las Plamas de Gran Canaria, Spain
  • Volume
    9
  • Issue
    3
  • fYear
    2001
  • fDate
    6/1/2001 12:00:00 AM
  • Firstpage
    461
  • Lastpage
    473
  • Abstract
    In this paper, we present experimental results obtained during the modeling, design, and implementation of a full set of versions of SPARC v.8 Integer Unit cores aimed at embedded applications. VHDL is the description language, Synopsys is the tool used for logical synthesis, and Duet Technologies´ Epoch for obtaining the physical layout of the final circuits. These are mapped to 0.50- and 0.35-/spl mu/m, three metal layer processes in order to study the impact of VLSI scaling on SPARC microarchitectural features. The quantitative results obtained characterize suitable points in the design space. They show the extent to which microarchitecture, design, datapath granularity, and megacell decisions affect performance and cost functions. Design space exploration down to physical layouts is made possible by modeling techniques based on configurable VHDL descriptions.
  • Keywords
    VLSI; embedded systems; hardware description languages; integrated circuit design; integrated circuit modelling; logic design; microprocessor chips; 0.35 micron; 0.50 micron; Duet Technologies Epoch; SPARC v.8 Integer Unit; Synopsys; VHDL model; VLSI microarchitecture; circuit layout; datapath granularity; embedded processor core; hardware description language; logic synthesis; megacell operator; system-on-a-chip design; Circuit synthesis; Clocks; Design methodology; Design optimization; Instruction sets; Intellectual property; Microarchitecture; Space technology; System-on-a-chip; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.929580
  • Filename
    929580