• DocumentCode
    1503257
  • Title

    Analysis of Key Comparisons Incorporating Knowledge About Bias

  • Author

    Lira, Ignacio ; Chunovkina, Anna ; Elster, Clemens ; Wöger, Wolfgang

  • Author_Institution
    Dept. of Mech. & Metall. Eng., Pontificia Univ. Catolica de Chile, Santiago, Chile
  • Volume
    61
  • Issue
    8
  • fYear
    2012
  • Firstpage
    2079
  • Lastpage
    2084
  • Abstract
    A method is proposed for analyzing key comparison data. It is based on the assumption that each laboratory participating in the comparison exercise obtains independent and consistent estimates of the measurand and that, in addition, each laboratory provides an estimate of the quantity that collects all systematic effects that the laboratory took into account. The unknown value of the latter quantity, subtracted from its estimate, is defined as the laboratory´s bias. The uncertainties associated with the estimates of the measurand and with the vanishing biases´ estimates are also assumed to be reported. In this paper, we show that the information provided in this way may be of help for judging the performances of the laboratories in their correction of systematic effects. This is done by developing formulas for the final (consensus) estimates and uncertainties of the measurand and of the biases. Formulas for the final estimates and uncertainties of the pairwise differences between the biases are also developed. An example involving simulated key comparison data makes apparent the benefits of the proposed approach.
  • Keywords
    measurement errors; measurement uncertainty; statistical analysis; laboratory bias estimation; measurement uncertainty; performance evaluation; systematic effect; vanishing bias estimation; Atmospheric measurements; Bismuth; Laboratories; Measurement uncertainty; Particle measurements; Systematics; Uncertainty; Bayesian methods; Gaussian distribution; measurement uncertainty; performance evaluation; statistical analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2012.2193690
  • Filename
    6189781