• DocumentCode
    1503304
  • Title

    Scanning the issue - Interconnections - addressing the next challenge of IC technology (part II: design, characterization, and modeling)

  • Author

    Schutt-Aine, J.E. ; Sung-Mo Kang

  • Author_Institution
    University of Illinois at Urbana-Champaign
  • Volume
    89
  • Issue
    5
  • fYear
    2001
  • fDate
    5/1/2001 12:00:00 AM
  • Firstpage
    583
  • Lastpage
    585
  • Abstract
    Provides an overview of the technical articles and features presented in this issue.
  • Keywords
    Analytical models; Clocks; Crosstalk; Design automation; Design engineering; Fabrication; Integrated circuit interconnections; Integrated circuit modeling; Special issues and sections; Submillimeter wave technology;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2001.929645
  • Filename
    929645