Title :
Study of effect of aging on transparent current stability of semiconductor lasers
Author :
Lee, San-Liang ; Hsu, Yu-Yi
Author_Institution :
Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
fDate :
6/7/2001 12:00:00 AM
Abstract :
Wavelength sensing using the wavelength-dependent transparency of laser diodes requires long-term stability of the transparent current. An accelerated aging test has been performed that demonstrates that the transparent current becomes stable over a wide range of wavelengths after 300 h of aging
Keywords :
ageing; laser stability; life testing; semiconductor device reliability; semiconductor device testing; semiconductor lasers; 300 h; accelerated aging test; long-term stability; semiconductor lasers; transparent current stability; wavelength-dependent transparency;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20010509
