• DocumentCode
    1503660
  • Title

    Selfaligned AlGaAs/GaAs HBT grown by MOMBE

  • Author

    Ren, Fengyuan ; Fullowan, T.R. ; Abernathy, C.R. ; Pearton, S.J. ; Smith, Peter ; Kopf, R.F. ; Laskowski, E.J. ; Lothian, J.R.

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • Volume
    27
  • Issue
    12
  • fYear
    1991
  • fDate
    6/6/1991 12:00:00 AM
  • Firstpage
    1054
  • Lastpage
    1056
  • Abstract
    The very low parasitic resistance n-p-n GaAs/AlGaAs heterojunction bipolar transistors (HBT) grown by metal organic molecular beam epitaxy (MOMBE) using all gaseous source dopants are reported. The carbon and tin dopants were introduced through the uses of trimethygallium (TMGa) and tetraethyltin (TESn). To achieve the low parasitics, the graded InGaAs emitter cap layer was doped with tin to 5*1019 cm-3 and the doping level in the subcollector was 3*1018 cm-3. The emitter and collector sheet resistances were 25 Omega / Square Operator and 10 Omega / Square Operator , respectively. The 800 AA thick base layer was carbon doped to a level of 7*1019 cm-3. The base contact resistance and sheet resistance were 0.1 Omega mm and 180 Omega / Square Operator , respectively. With a thin AlGaAs surface passivation layer for the emitter-base junction, the common emitter DC current gain was maintained up to 25, even for 2*5 mu m2 emitter size devices. The unity short circuit current gain cutoff frequency fT, and maximum oscillation frequency fmax, were 48 and 63 GHz, respectively.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; molecular beam epitaxial growth; solid-state microwave devices; 48 GHz; 63 GHz; AlGaAs surface passivation layer; AlGaAs-GaAs; HBT; InGaAs:Sn graded emitter cap layer; MBE; MOMBE; emitter-base junction; gaseous source dopants; heterojunction bipolar transistors; metal organic molecular beam epitaxy; n-p-n devices; self aligned device; subcollector; tetraethyltin; trimethygallium; very low parasitic resistance;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19910655
  • Filename
    76189