DocumentCode :
1503660
Title :
Selfaligned AlGaAs/GaAs HBT grown by MOMBE
Author :
Ren, Fengyuan ; Fullowan, T.R. ; Abernathy, C.R. ; Pearton, S.J. ; Smith, Peter ; Kopf, R.F. ; Laskowski, E.J. ; Lothian, J.R.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Volume :
27
Issue :
12
fYear :
1991
fDate :
6/6/1991 12:00:00 AM
Firstpage :
1054
Lastpage :
1056
Abstract :
The very low parasitic resistance n-p-n GaAs/AlGaAs heterojunction bipolar transistors (HBT) grown by metal organic molecular beam epitaxy (MOMBE) using all gaseous source dopants are reported. The carbon and tin dopants were introduced through the uses of trimethygallium (TMGa) and tetraethyltin (TESn). To achieve the low parasitics, the graded InGaAs emitter cap layer was doped with tin to 5*1019 cm-3 and the doping level in the subcollector was 3*1018 cm-3. The emitter and collector sheet resistances were 25 Omega / Square Operator and 10 Omega / Square Operator , respectively. The 800 AA thick base layer was carbon doped to a level of 7*1019 cm-3. The base contact resistance and sheet resistance were 0.1 Omega mm and 180 Omega / Square Operator , respectively. With a thin AlGaAs surface passivation layer for the emitter-base junction, the common emitter DC current gain was maintained up to 25, even for 2*5 mu m2 emitter size devices. The unity short circuit current gain cutoff frequency fT, and maximum oscillation frequency fmax, were 48 and 63 GHz, respectively.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; molecular beam epitaxial growth; solid-state microwave devices; 48 GHz; 63 GHz; AlGaAs surface passivation layer; AlGaAs-GaAs; HBT; InGaAs:Sn graded emitter cap layer; MBE; MOMBE; emitter-base junction; gaseous source dopants; heterojunction bipolar transistors; metal organic molecular beam epitaxy; n-p-n devices; self aligned device; subcollector; tetraethyltin; trimethygallium; very low parasitic resistance;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19910655
Filename :
76189
Link To Document :
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