DocumentCode :
1503803
Title :
On the Measurement of the Thermal Resistance of Vertical-External-Cavity Surface-Emitting Lasers (VECSELs)
Author :
Heinen, Bernd ; Zhang, Fan ; Sparenberg, Mino ; Kunert, Bernardette ; Koch, Martin ; Stolz, Wolfgang
Author_Institution :
Mater. Sci. Center & the Dept. of Phys., Philipps-Univ. Marburg, Marburg, Germany
Volume :
48
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
934
Lastpage :
940
Abstract :
Heat management is a key concern in the development of vertical-external-cavity surface-emitting lasers. Especially, high power systems are mainly limited by their heat transfer capabilities. A commonly used quantitative measure for the heat flow in such systems is the thermal resistance. So far, the thermal resistance is usually determined by evaluating the shift rates of the emission spectrum induced by varying the heat sink temperature and the input power. Yet, in multimode operation, the shift rates at the lower and the upper wavelength limit of the emission spectrum differ. In this paper, we will investigate the connection between the emission wavelength and the temperature profile inside the gain medium. We will show that the thermal resistance corresponding to the maximum pump spot temperature can only be obtained, by considering the shift rates at the long wavelength limit of the emission spectrum. Furthermore, we will show that the roll-over temperature is independent of the heat sink temperature. Based on this finding we present a novel technique, which enables the determination of the thermal resistance without the need for spectrally resolved measurements. The new technique surpasses the wavelength shift-based method both in terms of accuracy and measurement speed.
Keywords :
heat sinks; surface emitting lasers; thermal management (packaging); thermal resistance measurement; VECSEL; emission spectrum; emission wavelength; gain medium; heat flow; heat management; heat sink temperature; heat transfer capabilities; high power systems; multimode operation; roll-over temperature; shift rates; temperature profile; thermal resistance measurement; vertical-external-cavity surface-emitting lasers; wavelength shift-based method; Electrical resistance measurement; Heat sinks; Surface emitting lasers; Temperature measurement; Thermal resistance; Wavelength measurement; Thermal resistance; thermal roll-over; transversal multimode; vertical-external-cavity surface-emitting laser (VECSEL);
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2012.2196678
Filename :
6190705
Link To Document :
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