DocumentCode :
1503859
Title :
Fixed-tuned submillimeter wavelength waveguide mixers using planar Schottky-barrier diodes
Author :
Hesler, Jeffrey L. ; Hall, William R. ; Crowe, Thomas W. ; Weikle, Robert M., II ; Deaver, Bascom S., Jr. ; Bradley, Richard F. ; Pan, Shing-Kuo
Author_Institution :
Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
Volume :
45
Issue :
5
fYear :
1997
fDate :
5/1/1997 12:00:00 AM
Firstpage :
653
Lastpage :
658
Abstract :
The design, construction, and evaluation of fixed-tuned submillimeter wavelength waveguide mixers using planar Schottky diodes are presented in this paper. Electromagnetic fields within the planar diode package were analyzed using the finite-element method (FEM). Mixers using the University of Virginia SCIT5 planar diode were designed at both 585 and 690 GHz. A double sideband (DSB) system noise temperature of 2380 K was measured at 585 GHz using 1.16 mW of local oscillator (LO) power, and a system noise temperature of 2970 K DSB was measured at 690 GHz using 1.04 mW of LO power. In addition, the 585 GHz mixer was cooled to both 77 K and 4.2 K, with measured system noise temperatures of 1240 and 880-K DSB using LO powers of 0.47 and 0.14 mW, respectively. The modeling techniques were found to predict the measured conversion loss to within 1 dB. The performance of planar diode mixers is now within a factor of 1.5 of the best whisker-contacted Schottky diode mixers in this frequency range
Keywords :
Schottky diode mixers; circuit noise; finite element analysis; submillimetre wave mixers; 0.14 mW; 0.47 mW; 1.04 mW; 1.16 mW; 4.2 K; 585 GHz; 690 GHz; 77 K; DSB system noise temperature; LO powers; SCIT5 planar diode; conversion loss; electromagnetic fields; finite-element method; fixed-tuned submillimeter wavelength waveguide mixers; local oscillator power; planar Schottky-barrier diodes; Electromagnetic analysis; Electromagnetic fields; Electromagnetic waveguides; Mixers; Noise measurement; Packaging; Planar waveguides; Power measurement; Schottky diodes; Temperature measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.575581
Filename :
575581
Link To Document :
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