HBT´s RF noise parameter determination by means of an efficient method based on noise analysis of linear amplifier networks

Author

Rouquette, Philippe ; Gasquet, Daniel ; Holden, Tony ; Moult, Jonathan

Author_Institution

Centre d´´Electron. de Montpellier, Univ. des Sci. et Tech. du Languedoc, Montpellier, France

Volume

45

Issue

5

fYear

1997

fDate

5/1/1997 12:00:00 AM

Firstpage

690

Lastpage

694

Abstract

A method for the evaluation of the RF noise figure of heterojunction bipolar transistors (HBTs) is presented. The noise analysis is based on the use of the correlation matrices. The two-port device is described as an interconnection of basic two-port devices whose noise behaviour is known. The circuit theory of linear noisy networks allows that any two-port device can be replaced by a noise equivalent circuit which consists of the original two-port assumed to be noiseless and possess two additional noise sources. The purpose of this paper is to obtain the four noise parameters of the device, taking into account the excess resistances and inductances. The calculations presented show good agreement with measurements, and as a consequence, they permit a good estimation of the noise performance of the structure without neglecting any parasitic elements of the equivalent circuit

Keywords

equivalent circuits; heterojunction bipolar transistors; linear network analysis; matrix algebra; microwave bipolar transistors; semiconductor device models; semiconductor device noise; HBT noise; RF noise figure; RF noise parameter determination; correlation matrices; heterojunction bipolar transistors; linear amplifier networks; linear noisy networks; noise analysis; noise equivalent circuit; noise sources; parasitic elements; two-port device; Circuit noise; Circuit theory; Electrical resistance measurement; Equivalent circuits; Gallium arsenide; Heterojunction bipolar transistors; Integrated circuit interconnections; Noise figure; Radio frequency; Radiofrequency amplifiers;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.575587

Filename

575587