Title :
200 kHz absolute frequency stability in 1.5 mu m external-cavity semiconductor laser
Author :
Ishida, Osamu ; Toba, H.
Author_Institution :
NTT Transmission Syst. Labs., Take Yukosuka-shi Kanagawa, Japan
fDate :
6/6/1991 12:00:00 AM
Abstract :
The frequency of a 1.5 mu m external-cavity semiconductor laser (ECL) is stabilised by detecting an acetylene (C2H2) absorption line with an offset-tracking DBR laser. Absolute stability better than 200 kHz is achieved while a linewidth narrower than 140 kHz and a continuous tuning range of 4 GHz are retained.
Keywords :
laser frequency stability; laser tuning; semiconductor junction lasers; 1.5 micron; 200 kHz; absolute frequency stability; acetylene absorption line; continuous tuning range; external-cavity semiconductor laser; linewidth; offset-tracking DBR laser;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910633
