DocumentCode
1503977
Title
Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference
Author
Benfica, Juliano ; Poehls, Leticia M Bolzani ; Vargas, Fabian ; Lipovetzky, José ; Lutenberg, Ariel ; García, Sebastián E. ; Gatti, Edmundo ; Hernandez, Fernando
Author_Institution
Catholic University of Rio Grande do Sul (PUCRS), Porto Alegre, Brazil
Volume
59
Issue
4
fYear
2012
Firstpage
1015
Lastpage
1019
Abstract
Although measurement methods for Electromagnetic (EM) immunity and Total Ionizing Dose (TID) radiation are highly standardized, little effort has been made though, to evaluate the behavior of embedded systems under the combined effects. Considering realistic environment conditions only the measurement of these effects can guarantee reliable embedded systems for critical applications. A configurable platform to evaluate the effects of TID radiation and EM Interference (EMI) on embedded systems is presented. Experiments illustrate the consequences regarding delay and fault occurrence probability as well as current consumption and minimum power supply.
Keywords
Delay; Electromagnetic interference; Field programmable gate arrays; IEC standards; Noise; Power supplies; Voltage fluctuations; Electromagnetic immunity; embedded systems; total ionizing dose (TID) radiation;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2012.2190621
Filename
6190732
Link To Document