DocumentCode
1503983
Title
Improved Fine-Scale Laser Mapping of Component SEE Sensitivity
Author
Chugg, Andrew M. ; Ward, Jonathan ; McIntosh, James ; Flynn, Nathan ; Duncan, Peter H. ; Barber, Thomas S. ; Poivey, Christian
Author_Institution
Radiation Effects Group, MBDA UK Ltd., Filton, Bristol, UK
Volume
59
Issue
4
fYear
2012
Firstpage
1007
Lastpage
1014
Abstract
We have devised, implemented and demonstrated new scanning technology, smoother (uninterrupted) scanning algorithms and a capability to read selectable sub-sections of memory devices in order to accelerate laser SEE testing and address descrambling for interpreting MCU´s and burst errors.
Keywords
Acceleration; Laser beams; Microchip lasers; Sensitivity; Spirals; Trajectory; Piezoelectric transducers; pulsed lasers; semiconductor device radiation effects;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2012.2189582
Filename
6190733
Link To Document