• DocumentCode
    1504011
  • Title

    Artificial neural networks for fast and accurate EM-CAD of microwave circuits

  • Author

    Creech, Gregory L. ; Paul, Bradley J. ; Lesniak, Christopher D. ; Jenkins, Thomas J. ; Calcatera, Mark C.

  • Author_Institution
    Electron. Device Div., Wright Lab., Dayton, OH, USA
  • Volume
    45
  • Issue
    5
  • fYear
    1997
  • fDate
    5/1/1997 12:00:00 AM
  • Firstpage
    794
  • Lastpage
    802
  • Abstract
    A novel approach for achieving fast and accurate computer-aided design (CAD) of microwave circuits is described. The proposed approach enhances the ability to utilize electromagnetic (EM) analysis techniques in an interactive CAD environment through the application of neurocomputing technology. Specifically, a multilayer perceptron neural network (MLPNN) is implemented to model monolithic microwave integrated circuit (MMIC) passive elements using the element´s physical parameters. The strength of this approach is that only a minimum number of EM simulations of these passive elements are required to capture critical input-output relationships. The technique used to describe the data set required for model development is based on a statistical design of experiment (DoE) approach. Data generated from EM simulations are used to train the MLPNN which, once trained, is capable of modeling passive elements not included in the training set. The results presented indicate that the MLPNN can predict the s-parameters of these passive elements to nearly the same degree of accuracy as that afforded by EM simulation. The correlations between the MLPNN-computed and EM-simulated results are greater than 0.98 for each modeled parameter
  • Keywords
    MMIC; S-parameters; circuit CAD; design of experiments; multilayer perceptrons; statistical analysis; EM analysis techniques; EM-CAD; MLPNN; MMIC passive elements; critical input-output relationships; interactive CAD environment; microwave circuits; multilayer perceptron neural network; neurocomputing technology; physical parameters; s-parameters; statistical design of experiment; Application software; Artificial neural networks; Design automation; Electromagnetic analysis; Integrated circuit modeling; Integrated circuit technology; MMICs; Microwave circuits; Multilayer perceptrons; Neural networks;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.575602
  • Filename
    575602