• DocumentCode
    1504186
  • Title

    Incremental Large-Scale Electrostatic Analysis

  • Author

    Ye, Zuochang ; Zhu, Zhenhai ; Phillips, Joel R.

  • Author_Institution
    Cadence Res. Labs., Berkeley, CA, USA
  • Volume
    28
  • Issue
    11
  • fYear
    2009
  • Firstpage
    1641
  • Lastpage
    1653
  • Abstract
    In this paper, we propose methods to accelerate the solution of multiple related linear systems of equations. Such systems arise, for example, in building pattern libraries for interconnect parasitic extraction, parasitic extraction under process variation, and parameterized interconnect characterization. Our techniques include methods based on a generalized form of ldquorecycledrdquo Krylov subspace methods that use the sharing of information between related systems of equations to accelerate the iterative solution and methods to reuse computational effort during system matrix setup. Experimental results on electrostatic problems demonstrate significant improvement over existing methods that are based on solving each system individually. The proposed methods are generic, fully treat nonlinear perturbations without approximation and can potentially be applied to a wide variety of application domains outside electrostatic analysis.
  • Keywords
    capacitance; electrostatics; integrated circuit design; integrated circuit interconnections; iterative methods; perturbation techniques; electrostatic problems; incremental large-scale electrostatic analysis; interconnect parasitic extraction; iterative solution; linear systems of equations; nonlinear perturbations; parameterized interconnect characterization; pattern libraries; process variation; recycled Krylov subspace method; system matrix setup; Acceleration; Conductors; Data mining; Electrostatic analysis; Equations; Geometry; Iterative methods; Large-scale systems; Libraries; Linear systems; Capacitance extraction; Krylov subspace; electrostatic analysis; interconnect;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2009.2030267
  • Filename
    5290348