DocumentCode
1504283
Title
Parametric Identification of Parallel Hammerstein Systems
Author
Schoukens, Maarten ; Pintelon, Rik ; Rolain, Yves
Author_Institution
Dept. of Fundamental Electr. & Instrum. (ELEC), Vrije Univ. Brussel, Brussels, Belgium
Volume
60
Issue
12
fYear
2011
Firstpage
3931
Lastpage
3938
Abstract
This paper proposes a parametric identification method for parallel Hammerstein systems. The linear dynamic parts of the system are modeled by a parametric rational function in the z - or s-domain, while the static nonlinearities are represented by a linear combination of nonlinear basis functions. The identification method uses a three-step procedure to obtain initial estimates. In the first step, the frequency response function of the best linear approximation is estimated for different input excitation levels. In the second step, the power-dependent dynamics are decomposed over a number of parallel orthogonal branches. In the last step, the static nonlinearities are estimated using a linear least squares estimation. Furthermore, an iterative identification scheme is introduced to refine the estimates. This iterative scheme alternately estimates updated parameters for the linear dynamic systems and for the static nonlinearities. The method is illustrated on a simulation and a validation measurement example.
Keywords
approximation theory; frequency response; iterative methods; least squares approximations; parameter estimation; frequency response function; input excitation levels; iterative identification scheme; linear approximation; linear least squares estimation; nonlinear basis functions; parallel Hammerstein systems; parallel orthogonal branches; parametric identification method; parametric rational function; power-dependent dynamics; Linear approximation; Mathematical model; Matrix decomposition; Noise; Nonlinear distortion; Nonlinear systems; Parametric statistics; System identification; Best linear approximation (BLA); Uryson model; block structure; generalized Hammerstein; nonlinear system; parallel structure; system identification;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2011.2138370
Filename
5756231
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