• DocumentCode
    1504343
  • Title

    Modelling, decoupling and suppression of MOSFET distortion components

  • Author

    Shoucair, F.S.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    146
  • Issue
    1
  • fYear
    1999
  • fDate
    2/1/1999 12:00:00 AM
  • Firstpage
    37
  • Lastpage
    43
  • Abstract
    The author presents an analysis of the dominant distortion components of the drain current of a long-channel MOSFET in nonsaturation, which accounts explicitly for the modulation of the inversion layer mobility by transverse electric fields and for all bias and relevant process (SPICE) parameters. This model predicts that if the gate is driven by a linear and by a parabolic signal (α1VD+α2VD2 ), both derived from the drain signal VD, odd and even distortion components are decoupled and simultaneously suppressed by separately setting the constants α1 and α2 under normal bias conditions. In prior methods, these components are strongly coupled and their suppression requires a delicate body bias or signal (βVD) adjustment to offset the signal-dependent mobility modulation, which is impractical in monolithic applications. These predictions are confirmed by Fourier analysis and by SPICE simulations provided the mobility modulation parameter matches experimental observations
  • Keywords
    Fourier analysis; MOSFET; SPICE; carrier mobility; electric distortion; inversion layers; semiconductor device models; Fourier analysis; SPICE parameters; body bias; distortion components; drain current; drain signal; inversion layer mobility; long-channel MOSFET; nonsaturation; normal bias conditions; parabolic signal; signal-dependent mobility modulation; transverse electric fields;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2409
  • Type

    jour

  • DOI
    10.1049/ip-cds:19990277
  • Filename
    762393