Title :
Sparsity level-aware threshold-based channel structure detection in OFDM systems
Author :
Najjar, Lotfollah
Author_Institution :
Lab. COSIM, Higher Sch. of Commun. of Tunis, Tunis, Tunisia
Abstract :
The structure detection of sparse channel impulse response (CIR) is addressed in the frame of OFDM systems. Tap-tuned thresholds, exploiting a priori knowledge about the channel sparsity level (CSL), are designed to optimise the detection error probability. Compared to former proposed thresholds, the CSL-aware thresholds lead to higher CIR structure true detection rates and to lower channel response mean squares error.
Keywords :
OFDM modulation; channel estimation; error statistics; mean square error methods; transient response; CIR structure; CSL-aware thresholds; OFDM system; detection error probability; mean squares error; sparse channel impulse response; sparsity level-aware threshold-based channel structure detection; tap-tuned thresholds;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2012.0287
