• DocumentCode
    1504625
  • Title

    A simulation technique for the evaluation of random error effects in time-domain measurement systems

  • Author

    Ferrari, Philippe ; Angenieux, G.

  • Author_Institution
    LAHC, Savoie Univ., Chambery, France
  • Volume
    50
  • Issue
    3
  • fYear
    2001
  • fDate
    6/1/2001 12:00:00 AM
  • Firstpage
    665
  • Lastpage
    671
  • Abstract
    While many papers deal with time-domain network analyzer calibration procedures for the correction of systematic errors, little work has been published about the treatment of random errors. This paper is focused on the evaluation of random error effects in time-domain measurement systems. As a first step, an experimental identification of the measurement system random errors is achieved. Random errors addressed are jitter, vertical noise, and fast time drifts. Based on this identification, mathematical models are developed to simulate random errors. At a second step, time-domain measurements are simulated with these random errors. These simulations are used to predict measurement system repeatability and dynamic range. Then, as an application example, simulations of the measurement of the complex propagation coefficient and S parameters of a lossy mismatched microstrip line are achieved. By comparison with real measurements, it is shown that random error effects can be accurately predicted by Monte Carlo simulations
  • Keywords
    Monte Carlo methods; S-parameters; calibration; measurement errors; microstrip lines; microwave reflectometry; network analysers; random noise; time-domain reflectometry; timing jitter; Monte Carlo simulation; S parameters; calibration; complex propagation coefficient; dynamic range; fast time drifts; jitter; lossy mismatched microstrip line; mathematical models; measurement system repeatability; random error effects evaluation; simulation technique; time-domain measurement systems; time-domain network analysis; time-domain reflectometry; vertical noise; Calibration; Dynamic range; Error correction; Jitter; Loss measurement; Mathematical model; Predictive models; Propagation losses; Scattering parameters; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.930438
  • Filename
    930438