CMOS Silicon Physical Unclonable Functions Based on Intrinsic Process Variability

Author

Stanzione, Stefano ; Puntin, Daniele ; Iannaccone, Giuseppe

Author_Institution

Dipt. di Ing. dell´´Inf.: Elettron., Inf., Telecomun., Univ. di Pisa, Pisa, Italy

Volume

46

Issue

6

fYear

2011

fDate

6/1/2011 12:00:00 AM

Firstpage

1456

Lastpage

1463

Abstract

This paper presents an extreme-low-power mixed-signal CMOS integrated circuit for product identification and anti-counterfeiting, which implements a physical unclonable function operating with a challenge-response scheme. We devise a series of circuits and algorithmic solutions based on the use of a process monitor and on the prediction of the erratic response bits which allow to suppress the effects of temperature, voltage supply and process variations in order to obtain a robust and reliable behavior.

Keywords

CMOS integrated circuits; cryptography; elemental semiconductors; low-power electronics; message authentication; mixed analogue-digital integrated circuits; radiofrequency identification; silicon; CMOS silicon physical unclonable function; RFID; anticounterfeiting; challenge-response scheme; extreme-low-power mixed-signal CMOS integrated circuit; intrinsic process variability; process monitor; process variation; product identification; secure authentication; temperature; voltage supply; Aging; Arrays; Authentication; Bit error rate; Inverters; Prototypes; Temperature measurement; Physical unclonable functions; RFID; process monitor; process variability; secure authentication;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/JSSC.2011.2120650

Filename

5756461