• DocumentCode
    1505162
  • Title

    A simple rate-equation-based thermal VCSEL model

  • Author

    Mena, P.V. ; Morikuni, J.J. ; Kang, S.M. ; Harton, A.V. ; Wyatt, K.W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    17
  • Issue
    5
  • fYear
    1999
  • fDate
    5/1/1999 12:00:00 AM
  • Firstpage
    865
  • Lastpage
    872
  • Abstract
    Motivated by the potentially large number of devices and simulations involved in optoelectronic system design, and the associated need for compact optoelectronic device models, we present a simple thermal model of vertical-cavity surface-emitting laser (VCSEL) light-current (LI) characteristics based on the laser rate equations and a thermal offset current. The model was implemented in conventional SPICE-like circuit simulators, including HSPICE, and used to simulate key features of VCSEL LI curves, namely, thermally dependent threshold current and output-power roll-over for a range of ambient temperatures. The use of the rate equations also allows simulation in other non-dc operating regimes. Our results compare favorably to experimental data from three devices reported in the literature
  • Keywords
    SPICE; semiconductor device models; semiconductor lasers; surface emitting lasers; HSPICE; SPICE-like circuit simulators; VCSEL LI curves; ambient temperatures; compact optoelectronic device models; laser rate equations; non-dc operating regimes; optoelectronic system design; output-power roll-over; rate equations; simple rate-equation-based thermal VCSEL model; simple thermal model; thermal offset current; thermally dependent threshold current; vertical-cavity surface-emitting laser light-current characteristics; Circuit simulation; Computational modeling; Equations; Laser modes; Resistance heating; Semiconductor lasers; Surface emitting lasers; Thermal resistance; Threshold current; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.762905
  • Filename
    762905