• DocumentCode
    1505168
  • Title

    Demonstration of sub-5 ps CML ring oscillator gate delay with reduced parasitic AlInAs/InGaAs HBT

  • Author

    Sokolich, Marko ; Kramer, Allan R. ; Boegeman, Young Kim ; Martinez, Rosanna R.

  • Author_Institution
    HRL Lab. LLC, Malibu, CA, USA
  • Volume
    22
  • Issue
    7
  • fYear
    2001
  • fDate
    7/1/2001 12:00:00 AM
  • Firstpage
    309
  • Lastpage
    311
  • Abstract
    We have demonstrated a gate delay of 4.9 ps and a power dissipation of 8 mW per CML inverter in an AlInAs-InGaAs HBT technology with 150 mV logic swing. The demonstration circuit was a 15-stage ring oscillator based on CML inverters with a fan-out of 1 and a nominal 3.1 V supply. The same circuit was measured to have a gate delay of 4.7 ps and a power dissipation of 13 mW per inverter using a 3.6 V supply, and a gate delay of 6.2 ps and a power dissipation of 2.4 mW per inverter with a 2.2 V supply. These are the fastest results for a bipolar transistor based logic family in any semiconductor and comparable to the fastest results for any logic family in any semiconductor. Because two gate delays are required for the simplest useful sequential logic circuits such as clocked flip-flops, this is a significant milestone in that it is the first, though somewhat idealized, demonstration that logic at 100 GHz is realizable in InP-based HBT.
  • Keywords
    III-V semiconductors; aluminium compounds; bipolar logic circuits; current-mode logic; delays; gallium arsenide; heterojunction bipolar transistors; high-speed integrated circuits; indium compounds; oscillators; 100 GHz; 2.2 to 3.6 V; 2.4 to 13 mW; 4.7 to 6.2 ps; AlInAs-InGaAs; AlInAs/InGaAs HBT technology; CML inverters; CML ring oscillator; InP; InP substrate; InP-based HBT; bipolar transistor based logic family; reduced parasitic HBT; ring oscillator gate delay; Bipolar transistors; Clocks; Delay; Heterojunction bipolar transistors; Logic; Power dissipation; Power measurement; Pulse inverters; Ring oscillators; Sequential circuits;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.930674
  • Filename
    930674