Permittivity Measurements at Microwave Frequencies Using Epsilon-Near-Zero (ENZ) Tunnel Structure

Author

Lobato-Morales, Humberto ; Murthy, D.V.B. ; Corona-Chávez, Alonso ; Olvera-Cervantes, José Luis ; Martínez-Brito, Juan ; Guerrero-Ojeda, Luis Gerardo

Author_Institution

Emerging Microwave Technol. Group (EMT), Inst. Nac. de Astrofis., Opt. y Electron. (INAOE), Tonantzintla, Mexico

Volume

59

Issue

7

fYear

2011

fDate

7/1/2011 12:00:00 AM

Firstpage

1863

Lastpage

1868

Abstract

A planar epsilon-near-zero (ENZ) tunnel structure implemented on substrate integrated waveguide (SIW) technology is used to evaluate the complex dielectric permittivity of various materials. Design, optimization, and fabrication of the ENZ tunnel structure are explained. Simulations and measurements on various dielectric samples using the cavity perturbation technique of the proposed structure are presented. Measured values of the permittivity are in good agreement with standard values. Sensitivity analyses are performed on the ENZ structure and the conventional SIW cavity techniques. The proposed structure has very high sensitivity, which yields more accurate results when compared to other techniques, such as perturbation of conventional cavities.

Keywords

microwave frequency convertors; permittivity measurement; sensitivity analysis; substrate integrated waveguides; cavity perturbation technique; dielectric permittivity; epsilon-near-zero tunnel structure; microwave frequencies; permittivity measurements; sensitivity analyses; substrate integrated waveguide technology; Cavity resonators; Dielectrics; Materials; Permittivity; Permittivity measurement; Tunneling; Cavity perturbation methods; epsilon-near-zero (ENZ); permittivity measurements; substrate integrated waveguide (SIW);

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/TMTT.2011.2132141

Filename

5756470