DocumentCode
1505412
Title
Special Section on the International Symposium on Semiconductor Manufacturing
Author
Otsuka, Nobuhiro ; Uchino, Toshiyuki
Volume
22
Issue
4
fYear
2009
Firstpage
417
Lastpage
418
Abstract
The ten papers in this special section were originally presented at the International Symposium on Semiconductor Manufacturing, held October 27-29, 2008, in Tokyo, Japan.
Keywords
Copper; Etching; Lithography; Metrology; Plasma applications; Process control; Rapid thermal annealing; Semiconductor device manufacture; Semiconductor process modeling; Special issues and sections;
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/TSM.2009.2031745
Filename
5291683
Link To Document