Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network

Author

Kim, Jingook ; Li, Liang ; Wu, Songping ; Wang, Hanfeng ; Takita, Yuzo ; Takeuchi, Hayato ; Araki, Kenji ; Fan, Jun ; Drewniak, James L.

Author_Institution

Sch. of Electr. & Comput. Eng., Ulsan Nat. Inst. of Sci. & Technol., Ulsan, South Korea

Volume

54

Issue

5

fYear

2012

Firstpage

1112

Lastpage

1124

Abstract

Closed-form expressions for transient power distribution network (PDN) noise caused by an IC switching current are derived for a PDN structure comprised of traces with decoupling capacitors. Criteria for identifying a dominant decoupling capacitor for an impulse switching current are also proposed. The derived PDN noise expressions are validated with measurements of currents at both local and bulk capacitors, the PDN impedance, and the total voltage noise in an operating consumer device.

Keywords

capacitors; integrated circuit noise; IC switching current; PDN impedance; PDN noise; PDN noise expressions; PDN structure; bulk capacitors; closed-form expressions; current measurements; decoupling capacitors; dominant decoupling capacitor; impulse switching current; maximum transient noise voltage; operating consumer device; power distribution network; total voltage noise; Capacitors; Closed-form solutions; Impedance; Integrated circuits; Noise; Switches; Transient analysis; Current measurement; design guideline; dynamic noise; power distribution network (PDN); switching current; target impedance; transient noise;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2012.2194786

Filename

6192317