DocumentCode :
1505518
Title :
A 1.2–6 Gb/s, 4.2 pJ/Bit Clock & Data Recovery Circuit With High Jitter Tolerance in 0.14 \\mu m CMOS
Author :
Van Der Wel, Arnoud P. ; Den Besten, Gerrit W.
Author_Institution :
R&D Eindhoven, NXP Semicond., Eindhoven, Netherlands
Volume :
47
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
1768
Lastpage :
1775
Abstract :
In this paper, a highly parallelized Clock & Data Recovery (CDR) circuit with phase feedback at the bit rate is presented. This parallel CDR features demultiplexing directly at the input, which reduces circuit speed requirements and enables extensive use of standard CMOS logic which only draws dynamic power, resulting in excellent power efficiency over a wide range of speeds: an almost constant 4.2 pJ/bit between 2.4 and 6 Gb/s. Parallel CDRs traditionally have limited loop bandwidth and jitter tolerance due to latency in the phase-feedback loop. Our architecture solves this problem by applying feedback at the bit rate, resulting in jitter tolerance beyond 4.3 Unit Interval at 1 MHz.
Keywords :
CMOS digital integrated circuits; circuit feedback; clock and data recovery circuits; demultiplexing; jitter; bit rate 1.2 Gbit/s to 6 Gbit/s; circuit speed reduction; demultiplexing; frequency 1 MHz; high jitter tolerance; limited loop bandwidth; parallel CDR circuit; parallel clock & data recovery circuit; phase-feedback loop; power efficiency; size 0.14 mum; standard CMOS logic; Bandwidth; Clocks; Delay; Detectors; Image edge detection; Jitter; Voltage-controlled oscillators; CMOS; clock & data recovery (CDR); high-speed serial link; interleaving; jitter tolerance; jitter tracking bandwidth; wide-range CDR;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2012.2191318
Filename :
6192332
Link To Document :
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