DocumentCode
1505759
Title
Time-Based Readout of a Silicon Photomultiplier (SiPM) for Time of Flight Positron Emission Tomography (TOF-PET)
Author
Powolny, F. ; Auffray, E. ; Brunner, S.E. ; Garutti, E. ; Goettlich, M. ; Hillemanns, H. ; Jarron, P. ; Lecoq, P. ; Meyer, T. ; Schultz-Coulon, H.C. ; Shen, W. ; Williams, M.C.S.
Author_Institution
Eur. Organ. for Nucl. Phys. (CERN), Geneva, Switzerland
Volume
58
Issue
3
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
597
Lastpage
604
Abstract
Time of flight (TOF) measurements in positron emission tomography (PET) are very challenging in terms of timing performance, and should ideally achieve less than 100 ps FWHM precision. We present a time-based differential technique to read out silicon photomultipliers (SiPMs) which has less than 20 ps FWHM electronic jitter. The novel readout is a fast front end circuit (NINO) based on a first stage differential current mode amplifier with 20 Ω input resistance. Therefore the amplifier inputs are connected differentially to the SiPM´s anode and cathode ports. The leading edge of the output signal provides the time information, while the trailing edge provides the energy information. Based on a Monte Carlo photon-generation model, HSPICE simulations were run with a 3 × 3 mm2 SiPM-model, read out with a differential current amplifier. The results of these simulations are presented here and compared with experimental data obtained with a 3 × 3 × 15 mm3 LSO crystal coupled to a SiPM. The measured time coincidence precision and the limitations in the overall timing accuracy are interpreted using Monte Carlo/SPICE simulation, Poisson statistics, and geometric effects of the crystal.
Keywords
Monte Carlo methods; Poisson distribution; SPICE; digital readout; jitter; photomultipliers; positron emission tomography; semiconductor counters; silicon; FWHM; HSPICE; LSO crystal; Monte Carlo photon-generation model; NINO; Poisson statistics; Si; TOF-PET; differential current amplifier; electronic jitter; silicon photomultiplier; size 3 mm; time of flight positron emission tomography; time-based differential technique; time-based readout; timing accuracy; Crystals; Detectors; Integrated circuit modeling; Jitter; Monte Carlo methods; Photonics; Timing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2011.2119493
Filename
5756679
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