Title :
Time-Based Readout of a Silicon Photomultiplier (SiPM) for Time of Flight Positron Emission Tomography (TOF-PET)
Author :
Powolny, F. ; Auffray, E. ; Brunner, S.E. ; Garutti, E. ; Goettlich, M. ; Hillemanns, H. ; Jarron, P. ; Lecoq, P. ; Meyer, T. ; Schultz-Coulon, H.C. ; Shen, W. ; Williams, M.C.S.
Author_Institution :
Eur. Organ. for Nucl. Phys. (CERN), Geneva, Switzerland
fDate :
6/1/2011 12:00:00 AM
Abstract :
Time of flight (TOF) measurements in positron emission tomography (PET) are very challenging in terms of timing performance, and should ideally achieve less than 100 ps FWHM precision. We present a time-based differential technique to read out silicon photomultipliers (SiPMs) which has less than 20 ps FWHM electronic jitter. The novel readout is a fast front end circuit (NINO) based on a first stage differential current mode amplifier with 20 Ω input resistance. Therefore the amplifier inputs are connected differentially to the SiPM´s anode and cathode ports. The leading edge of the output signal provides the time information, while the trailing edge provides the energy information. Based on a Monte Carlo photon-generation model, HSPICE simulations were run with a 3 × 3 mm2 SiPM-model, read out with a differential current amplifier. The results of these simulations are presented here and compared with experimental data obtained with a 3 × 3 × 15 mm3 LSO crystal coupled to a SiPM. The measured time coincidence precision and the limitations in the overall timing accuracy are interpreted using Monte Carlo/SPICE simulation, Poisson statistics, and geometric effects of the crystal.
Keywords :
Monte Carlo methods; Poisson distribution; SPICE; digital readout; jitter; photomultipliers; positron emission tomography; semiconductor counters; silicon; FWHM; HSPICE; LSO crystal; Monte Carlo photon-generation model; NINO; Poisson statistics; Si; TOF-PET; differential current amplifier; electronic jitter; silicon photomultiplier; size 3 mm; time of flight positron emission tomography; time-based differential technique; time-based readout; timing accuracy; Crystals; Detectors; Integrated circuit modeling; Jitter; Monte Carlo methods; Photonics; Timing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2119493