Title :
Variation of the trip point in the ORNL type safety system
Author :
Cockrell, J. L. ; Ricker, C. W.
Author_Institution :
Leeds & Northrup Company, Philadelphia, Pa.
Abstract :
In reactor control instrumentation, such as the ORNL (Oak Ridge National Laboratory) system, certain interactions accompany the interconnection of safety amplifiers. These interactions, or loading effects, are discussed in order to facilitate understanding of the unavoidable variations in trip or scram point.
Keywords :
Cathodes; Electron tubes; Impedance; Inductors; Loading; Preamplifiers; Safety;
Journal_Title :
Electrical Engineering
DOI :
10.1109/EE.1959.6446142
