• DocumentCode
    1505780
  • Title

    Nonlinear Induced Variance of Frequency Response Function Measurements

  • Author

    Schoukens, Johan ; Barbé, Kurt ; Vanbeylen, Laurent ; Pintelon, Rik

  • Author_Institution
    Dept. of Fundamental Electr. & Instrum. (ELEC), Vrije Univ. Brussel, Brussels, Belgium
  • Volume
    59
  • Issue
    9
  • fYear
    2010
  • Firstpage
    2468
  • Lastpage
    2474
  • Abstract
    This paper analyzes the variance of the estimated frequency response function (FRF) ĜBLA of the best linear approximation ĜBLA to a nonlinear system that is driven by random excitations. ĜBLA varies not only due to the disturbing measurement and process noise but also over different realizations of the random excitation because the nonlinear distortions depend on the input realization. It will be shown that the variance expression σBLA2 that is obtained in the linear framework can also be used to calculate the variance that is induced by the nonlinear distortions. This validates the common engineering practice, where the linear FRF methodology is often used under nonlinear conditions.
  • Keywords
    frequency response; function approximation; measurement systems; nonlinear distortion; nonlinear systems; FRF methodology; frequency response function measurement; linear approximation; nonlinear distortions; nonlinear induced variance; nonlinear system; random excitations; Model uncertainty; nonlinear systems; variance frequency response function (FRF);
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2032967
  • Filename
    5291739