DocumentCode
1505780
Title
Nonlinear Induced Variance of Frequency Response Function Measurements
Author
Schoukens, Johan ; Barbé, Kurt ; Vanbeylen, Laurent ; Pintelon, Rik
Author_Institution
Dept. of Fundamental Electr. & Instrum. (ELEC), Vrije Univ. Brussel, Brussels, Belgium
Volume
59
Issue
9
fYear
2010
Firstpage
2468
Lastpage
2474
Abstract
This paper analyzes the variance of the estimated frequency response function (FRF) ĜBLA of the best linear approximation ĜBLA to a nonlinear system that is driven by random excitations. ĜBLA varies not only due to the disturbing measurement and process noise but also over different realizations of the random excitation because the nonlinear distortions depend on the input realization. It will be shown that the variance expression σĜBLA2 that is obtained in the linear framework can also be used to calculate the variance that is induced by the nonlinear distortions. This validates the common engineering practice, where the linear FRF methodology is often used under nonlinear conditions.
Keywords
frequency response; function approximation; measurement systems; nonlinear distortion; nonlinear systems; FRF methodology; frequency response function measurement; linear approximation; nonlinear distortions; nonlinear induced variance; nonlinear system; random excitations; Model uncertainty; nonlinear systems; variance frequency response function (FRF);
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2009.2032967
Filename
5291739
Link To Document