DocumentCode
1505793
Title
Superlattice
Hot Spot Cooling
Author
Litvinovitch, Viatcheslav ; Wang, Peng ; Bar-Cohen, Avram
Author_Institution
BAE Syst., Nashua, NH, USA
Volume
33
Issue
1
fYear
2010
fDate
3/1/2010 12:00:00 AM
Firstpage
229
Lastpage
239
Abstract
Proposed uses of solid-state thermoelectric microcoolers for hot spot remediation have included the formation of a superlattice layer on the back of the microprocessor chip, but there have been few studies on the cooling performance of such devices. This paper provides the results of 3-D, electrothermal, finite element modeling of a superlattice microcooler, focusing on the hot spot temperature and superlattice surface temperature reductions, respectively. Simulated temperature distributions and heat flow patterns in the silicon, associated with variations in microcooler geometry, chip thickness, hot spot size, hot spot heat flux, and superlattice thickness are provided. Comparison is made to hot spot cooling achieved by the Peltier effect in the silicon microprocessor chip itself. The numerical results suggest that, for a variety of operating conditions and geometries, while increasing the superlattice thickness serves to decrease the exposed superlattice surface temperature, it is ineffective in reducing the hot spot temperature below that due to the silicon Peltier effect.
Keywords
Peltier effect; cooling; finite element analysis; superlattices; thermal management (packaging); thermoelectric devices; μTEC; Peltier effect; finite element modeling; hot spot cooling; hot spot remediation; hot spot temperature; silicon microprocessor chip; solid-state thermoelectric microcoolers; superlattice microcooler; superlattice surface temperature reductions; Cooling; Electrothermal effects; Geometry; Microprocessor chips; Silicon; Solid state circuits; Superlattices; Temperature; Thermoelectric devices; Thermoelectricity; Cooling; SiGe; hot spot; microcooler; superlattice; thermal management; thermoelectric;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/TCAPT.2009.2032297
Filename
5291741
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