• DocumentCode
    1505800
  • Title

    Impedance Characteristics and Parasitic Speed Limitations of High-Speed 850-nm VCSELs

  • Author

    Ou, Y. ; Gustavsson, J.S. ; Westbergh, P. ; Haglund, Å ; Larsson, A. ; Joel, A.

  • Author_Institution
    Dept. of Microtechnol. & Nanosci. (MC2), Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    21
  • Issue
    24
  • fYear
    2009
  • Firstpage
    1840
  • Lastpage
    1842
  • Abstract
    The impedance characteristics of high-speed oxide-confined 850-nm vertical-cavity surface-emitting lasers have been studied with the aim of identifying the importance of device parasitics for the modulation bandwidth. Through equivalent circuit modeling, it is confirmed that device parasitics have a major impact on the bandwidth and the importance of each individual circuit element has been investigated. According to the extrapolation of the parameters derived from S11 measurements below 20 GHz towards higher frequencies and assuming that the mesa capacitance can be reduced by adding a few extra oxide layers without significantly affecting series resistance, our model predicts that the 3-dB parasitic frequency can be increased from 22 to above 30 GHz. Accounting also for bandwidth limitations due to thermal effects, we expect an increase of the modulation bandwidth of several gigahertz which may enable direct current modulation at 40 Gb/s.
  • Keywords
    equivalent circuits; high-speed optical techniques; optical modulation; surface emitting lasers; bit rate 40 Gbit/s; direct current modulation; equivalent circuit; high-speed VCSEL; impedance characteristics; mesa capacitance; modulation bandwidth; parasitic speed limitations; series resistance; vertical cavity surface emitting lasers; wavelength 850 nm; Electrical parasitics; high speed; impedance; modulation bandwidth; vertical-cavity surface-emitting laser (VCSEL);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2009.2034618
  • Filename
    5291742