DocumentCode :
1505862
Title :
Performance Improvement of AlGaAs/GaAs QWIP by {\\rm NH}_{3} Plasma Treatment
Author :
Lee, Jheng-Han ; Chang, Che-Yu ; Li, Chang-Hung ; Lin, Shih-Yen ; Lee, Si-Chen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
48
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
922
Lastpage :
926
Abstract :
The performance of AlGaAs/GaAs quantum well infrared photodetectors (QWIPs) with and without NH3 plasma treatment are investigated. It is demonstrated that the NH3 plasma treatment not only gets rid of the oxide defects, such as Ga2O3, As2O3, and As2O5, but also prevents the formation of oxides on the GaAs surface when exposed to atmosphere for one month. The peak responsivity of the QWIPs without NH3 plasma treatment is 0.48 A/W, and the detectivity is 3.13×109 cm-Hz1/2/W at 1.5 V and 60 K. However, the QWIP after the 10-m NH3 plasma treatment exhibits a better performance. The highest operation temperature can be increased from 60 to 90 K. At 90 K, the peak responsivity of the QWIP is 1.25 A/W and the detectivity is 3.54×109 cm-Hz1/2/W at 1.5 V.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; infrared detectors; photodetectors; plasma CVD; quantum well devices; AlGaAs-GaAs; NH3 plasma treatment; QWIP detectivity; QWIP responsivity; operation temperature; oxide defects; oxide formation; performance improvement; quantum well infrared photodetectors; temperature 60 K to 90 K; voltage 1.5 V; Dark current; Educational institutions; Gallium arsenide; Photodetectors; Plasma temperature; Surface treatment; Infrared photodetectors; plasma chemical vapor deposition (CVD); quantum well; quantum well devices;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2012.2196412
Filename :
6193113
Link To Document :
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