Imaging of high-power microwave-induced surface flashover

Author

Neuber, A. ; Hemmert, D. ; Dickens, J. ; Krompholz, H. ; Hatfield, L.L. ; Kristiansen, M.

Author_Institution

Dept. of Electr. Eng., Texas Tech. Univ., Lubbock, TX, USA

Volume

27

Issue

1

fYear

1999

fDate

2/1/1999 12:00:00 AM

Firstpage

138

Lastpage

139

Abstract

Using two gated intensified digital charge-coupled device cameras, one sensitive in the near infrared to ultraviolet region and one in the soft X-ray region, the temporal development of high-power microwave-induced surface flashover across a vacuum/dielectric interface has been imaged. The emission of X-ray radiation from the interface is caused by field emitted electrons accelerated in the high electromagnetic field impacting the solid. This generation of bremsstrahlung terminates at the moment of full flashover development that is indicated by the optical light emission. A rising plasma density above the dielectric surface due to electron induced outgassing triggers this behavior

Keywords

CCD image sensors; X-ray imaging; flashover; infrared imaging; optical images; plasma density; plasma diagnostics; surface discharges; bremsstrahlung; dielectric surface; electron induced outgassing; field emitted electrons; full flashover development; gated intensified digital charge-coupled device cameras; high electromagnetic field; high-power microwave-induced surface flashover; imaging; near infrared to ultraviolet region; optical light emission; rising plasma density; soft X-ray region; temporal development; vacuum/dielectric interface; Dielectric devices; Digital cameras; Electromagnetic radiation; Electron emission; Flashover; Infrared imaging; Microwave devices; Microwave imaging; Optical imaging; X-ray imaging;

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/27.763092

Filename

763092