Title :
Two-dimensional multifluid modeling of the He-Xe discharge in an AC plasma display panel
Author :
Jeong, Heui Seob ; Shin, Buhm-Jae ; Whang, Ki-Woong
Author_Institution :
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
fDate :
2/1/1999 12:00:00 AM
Abstract :
A numerical analysis of the discharge plasma which forms in an AC plasma display panel cell has been made using time-dependent, two-dimensional multifluid equations to understand the discharge physics of He-Xe discharge. The time dependent distributions of the plasma parameters such as the electron temperature, electron density, various ion densities, and excited state species densities, etc., are obtained during the sustain period in a surface type AC plasma display panel (PDP) cell. Because of its importance in the AC PDP operation, the behavior of the wail charges accumulated on the dielectric surface is also examined. It has been found that a DC bias voltage applied to the address electrode controls the distribution as well as the peak values of the plasma parameters. The reaction analysis showed that the dominant reaction process for Xe ion production is the direct electron impact ionization processes and not the Penning ionization process. The cells which have a smaller electrode gap and larger sustain electrode width could accumulate more wall charges and consequently require less voltage for discharge sustainment
Keywords :
gas mixtures; helium; numerical analysis; plasma displays; plasma simulation; xenon; AC plasma display panel cell; DP) cell.; He-Xe; He-Xe discharge; discharge physics; discharge plasma; electric surface; electron density; electron temperature; excited state species densities; ion densities; numerical analysis; plasma parameters; surface type AC plasma display panel (PDP) cel; sustain period; time dependent distributions; time-dependent, two-dimensional multifluid equations; two-dimensional multifluid modeling; Electrodes; Electrons; Equations; Numerical analysis; Physics; Plasma density; Plasma displays; Plasma temperature; Temperature dependence; Temperature distribution;
Journal_Title :
Plasma Science, IEEE Transactions on