DocumentCode :
1506017
Title :
Body-voltage estimation in digital PD-SOI circuits and its application to static timing analysis
Author :
Shepard, Kenneth L. ; Kim, Dae-Jin
Author_Institution :
Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
Volume :
20
Issue :
7
fYear :
2001
fDate :
7/1/2001 12:00:00 AM
Firstpage :
888
Lastpage :
901
Abstract :
Partially depleted silicon-on-insulator (PD-SOI) has emerged as a technology of choice for high-performance low-power deep-submicrometer digital integrated circuits. An important challenge to the successful use of this technology involves successfully managing and predicting the large “uncertainties” in the body potential and consequently the threshold voltages that can result from unknown past switching activity. In this paper, we present a unique state-diagram abstraction of the PD-SOI field-effect transistor that can capture all of the past switching activity determining the body voltage. Based on this picture, four different estimation schemes are discussed that increasingly bound floating body uncertainty based on more detailed knowledge of switching activity. Using these estimation techniques within a prototype transistor-level static timing analysis engine, we demonstrate both the accuracy of the estimation and the reduction in delay uncertainty possible with these techniques
Keywords :
MOS digital integrated circuits; delays; integrated circuit modelling; silicon-on-insulator; timing; body potential; body-voltage estimation; delay uncertainty; digital PD-SOI circuits; floating body uncertainty; partially depleted silicon-on-insulator; prototype transistor-level static timing analysis engine; state-diagram abstraction; switching activity; threshold voltages; Delay estimation; Digital integrated circuits; FETs; Integrated circuit technology; Prototypes; Silicon on insulator technology; Technology management; Threshold voltage; Timing; Uncertainty;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.931033
Filename :
931033
Link To Document :
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