• DocumentCode
    1506097
  • Title

    Basic expressions and approximations in small-signal parameter extraction for HBT´s

  • Author

    Li, Bin ; Prasad, Sheila

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
  • Volume
    47
  • Issue
    5
  • fYear
    1999
  • fDate
    5/1/1999 12:00:00 AM
  • Firstpage
    534
  • Lastpage
    539
  • Abstract
    Basic expressions and approximations used to extract small-signal parameters for heterojunction bipolar transistors or bipolar junction transistors are developed in this paper. A T-type small-signal equivalent circuit after deembedding the pad capacitances is used for the derivation. The relative magnitudes of ωRbcCbe , ωRbiCbc, and ωrcC bell were used to evaluate the frequency ranges. Fully numerical or partially numerical approaches can be developed by these approximations. An element parameter-extraction procedure is also given in this paper. Two special cases (“cold” bias and degrading equivalent circuits) are also discussed
  • Keywords
    capacitance; equivalent circuits; heterojunction bipolar transistors; HBT; T-type small-signal equivalent circuit; cold bias; degrading equivalent circuits; element parameter-extraction procedure; frequency ranges; heterojunction bipolar transistors; pad capacitance deembedding; small-signal parameter extraction; Bipolar transistors; Capacitance; Contact resistance; Data mining; Degradation; Design optimization; Equivalent circuits; Frequency; Heterojunction bipolar transistors; Parameter extraction;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.763151
  • Filename
    763151