• DocumentCode
    1506130
  • Title

    An Analytical Model for Conveyor-Based Material Handling System With Crossovers in Semiconductor Wafer Fabs

  • Author

    Nazzal, Dima ; Jimenez, Jesus A. ; Carlo, Hector J. ; Johnson, Andrew L. ; Lasrado, Vernet

  • Author_Institution
    Dept. of Ind. Eng. & Manage. Syst., Univ. of Central Florida, Orlando, FL, USA
  • Volume
    23
  • Issue
    3
  • fYear
    2010
  • Firstpage
    468
  • Lastpage
    476
  • Abstract
    This paper proposes a queueing-based analytical model useful in the design of closed-loop conveyor-based automated material handling system (AMHS), which has been identified as an effective material handling alternative in next-generation semiconductor wafer fabrication facilities. The model presented in this paper represents practical hardware considerations of the AMHS, such as turntables and crossovers. The objective is to accurately estimate the expected work-in-process (WIP) on the conveyor, queueing delays due to congestion at intersection points, as well as assessing the conveyor system stability. A four-phase approach is used to estimate the WIP. The proposed model is applied to the SEMATECH virtual 300 mm wafer fab. Experimental results demonstrate that in the worst case where the maximum number of crossovers is used and the traffic on the conveyor is high, the analytical model performs very well with average relative errors of 4.2%.
  • Keywords
    conveyors; mechanical stability; queueing theory; semiconductor device manufacture; work in progress; SEMATECH virtual wafer fab; closed-loop conveyor-based automated material handling system; conveyor system stability; crossovers; next-generation semiconductor wafer fabrication; queueing delay; queueing-based analytical model; turntables; work-in-process; Analytical models; automated material handling system (AMHS); conveyors; wafer fabrication;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2010.2051736
  • Filename
    5475200