• DocumentCode
    1506207
  • Title

    Analysis of optically controlled planar dielectric waveguides operating in the millimeter-wave band using FDTD

  • Author

    Farias, Rubem Gonçalves ; Giarola, Attilio Jose

  • Author_Institution
    Electr. Eng. Dept., Fed. Univ. of Para, Belem, Brazil
  • Volume
    47
  • Issue
    5
  • fYear
    1999
  • fDate
    5/1/1999 12:00:00 AM
  • Firstpage
    639
  • Lastpage
    642
  • Abstract
    The finite-difference time-domain (FDTD) technique is applied to the analysis of planar dielectric waveguides controlled by means of an optical beam. This beam, with an appropriate energy, induces a nonuniform plasma in a semiconductor layer deposited on the waveguide core. The resulting effects are analyzed through the phase dispersion characteristics. Due to the complexity of the problem, the FDTD formulation does not allow the calculation of the attenuation characteristic, particularly when the plasma presents an intermediate density, which causes a strong interaction with the guided mode. The simulations shown here suggest that the light beam may have an effective control of the phase response of a single waveguide and of the coupling between two parallel coupled waveguides
  • Keywords
    dielectric waveguides; dispersion (wave); finite difference time-domain analysis; optical control; planar waveguides; semiconductor plasma; waveguide theory; EHF; FDTD; attenuation characteristic; finite-difference time-domain technique; guided mode; millimeter-wave band; nonuniform plasma; optical beam; optically controlled waveguides; parallel coupled waveguides; phase dispersion characteristics; phase response control; planar dielectric waveguides; semiconductor layer; Dielectrics; Finite difference methods; Optical attenuators; Optical beams; Optical control; Optical planar waveguides; Optical waveguides; Planar waveguides; Semiconductor waveguides; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.763167
  • Filename
    763167