Title :
A 3.6 mW, 90 nm CMOS Gated-Vernier Time-to-Digital Converter With an Equivalent Resolution of 3.2 ps
Author :
Lu, Ping ; Liscidini, Antonio ; Andreani, Pietro
Author_Institution :
Dept. of Electr. & Inf. Technol., Lund Univ., Lund, Sweden
fDate :
7/1/2012 12:00:00 AM
Abstract :
Two gated ring oscillators (GROs) act as the delay lines in an improved Vernier time-to-digital converter (TDC), where the already small quantization noise of the standard Vernier TDC is further first-order shaped by the GRO operation. The TDC has been implemented in a 90 nm CMOS process and consumes 3 mA from 1.2 V when operating at 25 MHz. The native Vernier resolution of the TDC is 5.8 ps, while the total noise integrated over a bandwidth of 800 kHz yields an equivalent TDC resolution of 3.2 ps.
Keywords :
CMOS integrated circuits; time-digital conversion; CMOS gated-Vernier time-to-digital converter; GRO operation; bandwidth 800 kHz; current 3 mA; delay lines; frequency 25 MHz; gated ring oscillators; native Vernier resolution; power 3.6 mW; quantization noise; size 90 nm; standard Vernier TDC; time 3.2 ps; time 5.8 ps; voltage 1.2 V; Delay; Delay lines; Inverters; Logic gates; Noise; Oscillators; Quantization; Gated ring oscillator; Vernier delay line; time-to-digital converter;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2012.2191676