Title :
RF flip-module BGA package
Author :
Low, Yee L. ; Degani, Yinon ; Guinn, Keith V. ; Dudderrar, T. Dixon ; Gregus, Jeffrey A. ; Frye, Robert C.
Author_Institution :
Bell Labs, Lucent Technol., Murray Hill, NJ, USA
fDate :
5/1/1999 12:00:00 AM
Abstract :
We recently described a flip-chip package with integrated thin-film inductors and capacitors in a VCO tank circuit of a single chip GSM transceiver integrated circuit (IC). By embedding the passive components in a Si-on-Si substrate, we eliminated spurious resonances that were caused by the parasitics of the original 64-TQFP IC package. However, compared with the bare die, the resultant Si-on-Si structure is larger in all dimensions due to the inclusion of a flip-chip mounted transceiver IC and a surface-mount varactor. We have developed a novel BGA package structure with a hole milled in the center to accommodate the silicon-on-silicon assembly. The interconnections rely exclusively on flip-chip solder technology. To verify that the package does not degrade the performance of the RF circuits, we have performed electromagnetic field simulations to extract critical inductance and capacitance parameters. Parasitic inductances of the original TQFP and the new packages are comparable due to their similar dimensions. None the less, a major advantage of the new package structure is that it permits the integration of key passive components inside the package where they are unaffected by package parasitic impedances
Keywords :
ball grid arrays; flip-chip devices; RF flip-module BGA package; Si; VCO tank circuit; electrical model; electromagnetic field simulation; parasitic impedance; parasitic inductance; passive component; silicon-on-silicon substrate; single chip GSM transceiver integrated circuit; solder interconnection technology; thin film capacitor; thin film inductor; Capacitors; GSM; Integrated circuit packaging; Radio frequency; Resonance; Substrates; Thin film inductors; Transceivers; Varactors; Voltage-controlled oscillators;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/6040.763180