DocumentCode
1506618
Title
Interferometric Measurement of the Diameter of a Silicon Sphere With a Mechanical Scanning Method
Author
Luo, Zhiyong ; Gu, Yingzi ; Zhang, Jitao ; Yang, Lifeng ; Guo, Ligong
Author_Institution
Nat. Inst. of Metrol., Beijing, China
Volume
59
Issue
11
fYear
2010
Firstpage
2991
Lastpage
2996
Abstract
The diameter of a 1-kg silicon sphere needs to be accurately measured to determine the volume and density to investigate the Avogadro constant. The diameter of the silicon sphere was measured using phase-shifting interferometry with an algorithm with an accuracy of 0.01% of the phase period. The algorithm accurately analyzes the phase map without strict positioning of the phase-shifting step. A phase-shifting generator was then designed to accurately determine the diameter. The distances between the two Etalon plates were measured with a phase shift of 1 μm with the gaps between the surface of the silicon sphere and each Etalon plate measured with a phase shift of 2 μm by the mechanical scanning method. The Etalon cavity length changes by only 0.1 nm when the pressure is released. The combined standard uncertainty in the silicon sphere diameter is then less than 2.3 nm.
Keywords
diameter measurement; optical design techniques; phase shifting interferometry; silicon; Avogadro constant; Etalon cavity length; Etalon plates; algorithm; diameter measurement; interferometric measurement; mechanical scanning; optical design; phase-shifting generator; phase-shifting interferometry; silicon sphere; Algorithm design and analysis; Density measurement; Interference; Laser stability; Mechanical variables measurement; Phase measurement; Phase shifting interferometry; Shape measurement; Silicon; Volume measurement; Avogadro constant; interference fringe; multiple-beam interference; phase-shifting interferometry; precision measurements;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2010.2047043
Filename
5475272
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